Sule Ozev

Sule Ozev

Professor, School of Electrical, Computer and Energy Engineering
  • sule.ozev@asu.edu
  • 480-727-7547
  • ‌
  • ISTB4 565 TEMPE, AZ 85287
  • Mail code: 5706
    Campus: Tempe
  • ‌
Biography Research Teaching Public Work
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Long Bio

Professor Sule Ozev received her doctorate from University of California San Diego's Computer Science and Engineering Department in 2002. That same year, she joined Duke University's Electrical and Computer Engineering Department as an assistant professor. She worked on testing mixed-signal and radiofrequency circuits, built-in-self test techniques, analysis and mitigation of process variations, defect-tolerant microprocessor systems, and on-line, and off-line testing of microfluidic devices. In August 2008, she joined Arizona State University's Electrical Engineering Department (now School of Electrical, Computer and Energy Engineering) as an associate professor, continuing on the same line of research. She received National Science Foundation (NSF) CAREER award in 2006, and various other awards from NSF, SRC, NASA and IBM. She has published more than 100 conference and journal papers and holds one U.S. patent.

Education
  •  Ph.D. Computer Science and Engineering, University of California-San Diego 2002
  • M.S. Computer Science and Engineering, University of California-San Diego 1998
  • B.S. Electrical Engineering, Bogazici University, Turkey 1995
Research Interests

Self-test and self-calibration for analog, mixed-signal, and radiofrequency circuits, fault-tolerant and reconfigurable heterogeneous systems, fault simulation and test metrics evaluation for mixed-signal circuits.

Publications
  1. Avci, Muslum Emir, and Sule Ozev. "Low-Overhead RF Impedance Measurement Using Periodic Structures." IEEE Transactions on Microwave Theory and Techniques (2023).
  2. Bilgic, Bora, and Sule Ozev. "Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation." IEEE Design & Test (2023).
  3. Krishna Kashyap, Suhas, and Sule Ozev. "IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages." ACM Transactions on Design Automation of Electronic Systems 28.4 (2023): 1-23.
  4. Ince, Mehmet, Bora Bilgic, and Sule Ozev. "Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators." ACM Journal on Emerging Technologies in Computing Systems (JETC) 18, no. 3 (2022): 1-20.
  5. Badawi, Diaa, Ishaan Bassi, Sule Ozev, and A. Enis Cetin. "Deep-Learning-Based Gas Leak Source Localization From Sparse Sensor Data." IEEE Sensors Journal 22, no. 21 (2022): 20999-21008.
  6. Hongbi Pan, Ahmet Enis Cetin,  Diaa Badawi, Ishaan Bassi, Sule Ozev, “Detecting Anomaly in Chemical Sensors via L1-Kernel based Principal Component Analysis” in IEEE Sensors Journal, 2022.
  7. Ince, Mehmet, Bora Bilgic, and Sule Ozev. "Digital Fault Based Built-in Self-Test and Evaluation of Low Dropout Voltage Regulators." ACM Journal on Emerging Technologies in Computing Systems, Volume 18, Issue 3, July 2022,  Article No.: 54, pp 1–20.
  8. Janie Lynn Reavis, Huseyin Seckin Demir, Blair E Witherington, Michael Bresette, Jennifer M Blain Christen, Jesse F Senko, Sule Ozev, “Revealing Sea Turtle Behavior in Relation to Fishing Gear Using Color-coded Spatiotemporal Motion Patterns with Deep Neural Networks”, in Frontiers in Marine Science, 2022.
  9. M. Shafiee and S. Ozev, "An In-Field Programmable Adaptive CMOS LNA for Intelligent IoT Sensor Node Applications," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 41, no. 2, pp. 201-210, Feb. 2022.
  10. Badawi, Diaa, Agamyrat Agambayev, Sule Ozev, and A. Enis Cetin. "Real-time low-cost drift compensation for chemical sensors using a deep neural network with hadamard transform and additive layers." IEEE Sensors Journal 21, no. 16 (2021): 17984-17994.
  11. Karabacak, Fatih, Umit Ogras, and Sule Ozev. "Malicious Activity Detection in Lightweight Wearable and IoT Devices Using Signal Stitching." Sensors 21, no. 10 (2021): 3408.
  12. Ince, Mehmet, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, Leroy Winemberg, and Sule Ozev. "Fault-based Built-in Self-test and Evaluation of Phase Locked Loops." ACM Transactions on Design Automation of Electronic Systems (TODAES) 26, no. 3 (2021): 1-18.
  13. Demir, H. Seckin, Jennifer Blain Christen, and Sule Ozev. "Energy-Efficient Image Recognition System for Marine Life." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 39, no. 11 (2020): 3458-3466.
  14. Bhat, Ganapati, Ujjwal Gupta, Yigit Tuncel, Fatih Karabacak, Sule Ozev, and Umit Y. Ogras. "Self-Powered Wearable IoT Devices for Health and Activity Monitoring." Foundations and Trends® in Electronic Design Automation 13, no. 3 (2020): 145-269.
  15. Bhat, Ganapati; Gao, Hang; Mandal, Sumit K; Ogras, Umit Y; Ozev, Sule; "Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead", IEEE Design and Test, 2020.
  16. Erol, Osman Emir, and Sule Ozev. "A Reconfigurable 0.1–10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers." IEEE Transactions on Circuits and Systems I: Regular Papers 67, no. 7 (2020): 2216-2228.
  17. Badawi, Diaa; Ayhan, Tuba; Ozev, Sule; Yang, Chengmo; Orailoglu, Alex; Çetin, Ahmet Enis; “Detecting Gas Vapor Leaks Using Uncalibrated Sensors”, IEEE Access, 155701-155710, 2019.
  18. Li, Yanjun, Ender Yilmaz, Pete Sarson, and Sule Ozev. "Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements." ACM Transactions on Design Automation of Electronic Systems (TODAES) 24, no. 4 (2019): 45.
  19. Jeong, Jae Woong, Jennifer Kitchen, and Sule Ozev. "On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration." IEEE Design & Test 36, no. 3 (2019): 117-125.
  20. Shafiee, Maryam, and Sule Ozev. "Contact-less near-field test of active integrated RF phased array antennas." Journal of Electronic Testing 35, no. 3 (2019): 335-347.
  21. F. Karabacak, U. Y. Ogras and S. Ozev, “Remote Detection of Unauthorized Activity via Spectral Analysis,” ACM Trans. on Design Automation of Electronic Systems (TODAES), vol. 23, issue 6, Dec. 2018.
  22. Doohwang Chang, G. Bhat, U. Y. Ogras, B. Bakkaloglu, and S. Ozev, “Detection Mechanisms for Unauthorized Wireless Transmissions,” ACM Trans. on Design Automation of Electronic Systems (TODAES), vol. 23, issue 6, Dec. 2018.
  23. Erol, Osman Emir, and Sule Ozev. "Knowledge-and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications." ACM Transactions on Design Automation of Electronic Systems (TODAES) 24, no. 1 (2018): 3.
  24. M.Shafiee, Navankur Beoher, Priyanka Bakliwal, Sidhanta Roy, Debashis Mandal, Bertan Bakkaloglu, Sule Ozev, ”Disturbance–Free Built-in Self-Test and Diagnosis for DC-DC Converters”, to appear in ACM Transaction on Design Automation of Electronic Systems, 2017.
  25. Chang, D., Kitchen, J.N., Kiaei, S. and Ozev, S., 2017. In-field recovery of RF circuits from wearout based performance degradation. IEEE Transactions on Emerging Topics in Computing, 8(2), pp.442-452.
  26. N. Beohar, D. Mandal,  S. Ozev, and B. Bakkaloglu, “Online Built-In-Self-Test of High Switching Frequency DC-DC Converters Using Model Reference based System Identification Techniques” accepted for publication at IEEE Transactions on Circuits and Systems I: Regular Papers.
  27. Jeong, J.W., Natarajan, V., Sen, S., Mak, T.M., Kitchen, J. and Ozev, S., 2017. A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. ACM Transactions on Design Automation of Electronic Systems (TODAES), 23(1), pp.1-21.
  28. Suresh, Chandra KH, Ozgur Sinanoglu, and Sule Ozev*. "Adaptive Reduction of the Frequency Search Space for Multi-Vdd Digital Circuits Using Variation Sensitive Ring Oscillators”, to appear in IEEE Transactions on Computer-Aided Design.
  29. Ozel, Muhlis, Mike Cheperak, Tehmoor Dar, Sayfe Kiaei, Bertan Bakkaloglu, and Sule Ozev*. "An Electrical-Stimulus-Only BIST IC for Capacitive MEMS Accelerometer Sensitivity Characterization." IEEE Sensors Journal (2016).
  30. Chang, Doohwang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, and Sule Ozev*. "Monitor-Based In-Field Wearout Mitigation for CMOS LC Oscillators." IEEE Transactions on Device and Materials Reliability 16, no. 2 (2016): 183-193.
  31. Venkatasubramanian, Ramachandran, Robert Elio, and Sule Ozev*. "Process Independent Design Methodology for the Active RC and Single-Inverter-Based Rail Clamp." ACM Transactions on Design Automation of Electronic Systems (TODAES) 21, no. 3 pp.50:1-50:19(2016).
  32. Ramachandran Venkatasubramanian and Sule Ozev*, “Rail Clamp with Dynamic Time Constant Adjustment" in IEEE Journal of Solid State Circuits, v.51, n.5, pp. 1313-1324, May 2016.
  33. Doohwang Chang, Jennifer Kitchen, Sule Ozev*, “Design-Time Reliability Enhancement using Hotspot Identification for RF Circuits”, IEEE Transactions on VLSI Systems, V.24, n.3, pp.1179-1183, March 2016.
  34. Jaewoong Jeong, Afsaneh Nassery, Jennifer Kitchen, Sule Ozev*, “Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers”, in IEEE Transactions on VLSI Systems, v.24, n.6, pp. 2286-2298, June 2016.
  35. Suresh, Chandra KH, Ozgur Sinanoglu, and Sule Ozev*. "Adapting to Varying Distribution of Unknown Response Bits." ACM Transactions on Design Automation of Electronic Systems (TODAES) 21, no. 2 pp.33:1-33:22, (2016).
  36. Ramachandran Venkatasubramanian and Sule Ozev*, “A Comparator-Based Rail Clamp”, in IEEE Transactions on VLSI Systems, v.24, n.4, pp. 1493-1502, April 2016.
  37. Ender Yilmaz and Sule Ozev*, “Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation”, IEEE Design & Test Magazine, Volume:32 ,  Issue: 1, pp. 36-43, 2015.
  38. Suresh, Chandra KH, Ozgur Sinanoglu, and Sule Ozev*, “Adaptive Generation of Unique IDs for Digital Chips Through Analog Excitation”, ACM Transactions on Design Automation of Electronic Systems, 20(3), 46, 2015.
  39. Yilmaz, E.; Nassery, A.; Ozev, S*., "Built-In EVM Measurement With Negligible Hardware Overhead," IEEE Design & Test, 01/2015; 32(1):36-43.
  40. Afsaneh Nassery; Srinath Byregowda; Sule Ozev*; Marian Verhelst; Mustapha Slamani, “Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector”, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23(2), 331-341, 2015.
  41. Yilmaz, E.; Ozev*, S.; Butler, K. M., " Efficient Process Shift Detection and Test Realignment", Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, v.32, n.12, pp.1934- 1942, 2013.
  42. Welch, David, Sahil Shah, Sule Ozev, and J. Blain Christen*. "Experimental and Simulated Cycling of ISFET Electric Fields for Drift Reset." Electron Device Letters, IEEE 34, no. 3 (2013): 456-458.
  43. Nassery, Afsaneh, Osman Emir Erol, Sule Ozev*, and Marian Verhelst. "Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction." Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on 31, no. 6 (2012): 958-967.
  44. Yilmaz, E.; Ozev, S*.; Butler, K. M., "Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring," Very Large Scale Integration (VLSI) Systems, IEEE Transactions on , vol.PP, no.99, pp.1-10.
  45. Yilmaz, E.; Ozev, S*., "Test Application for Analog/RF Circuits With Low Computational Burden," Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on , vol.31, no.6, pp.968,979, June 2012.
  46. G. Radhakrishnan and S. Ozev*, “Adaptive Modeling of Analog/RF circuits for Efficient fault response Evaluation”, in Journal of Electronic Testing: Theory and Applications, Volume 27 Issue 4, August 2011, Pages 465-476.
  47. E. S. Erdogan and S. Ozev*, “A Multi-site Test Solution for Quadrature Modulation RF Transceivers”, in IEEE Transactions on Computer Aided Design.
  48. E. Acar and S. Ozev*, “Low Cost MIMO Testing for RF Integrated Circuits”, IEEE Transactions on VLSI Systems, Volume.18, Issue.9, September 2010, pp.1348-1356.
  49. E. S. Erdogan and S. Ozev*, “Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST”, IEEE Transactions on VLSI Systems, Volume.18, Issue.6, June 2010, pp.901-911.
  50. E. Acar and S. Ozev*, “Low-Cost Characterization and Calibration of RF Integrated Circuits through I–Q Data Analysis”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, “Volume 28,  Issue 7,  July 2009 Page(s):993 – 1005.
  51. S. Bahukudumbi, S. Ozev, K. Chakrabarty*, and V. Iyengar, “Wafer-Level Defect Screening for “Big-D/Small-A” Mixed-Signal SoCs”, IEEE Transactions on Very Large Scale Integrated (VLSI) Systems, VOL. 17, NO. 4, April 2009, pp. 587-592.
  52. E. Acar and S. Ozev*, “Defect Oriented Testing of RF Circuits”, in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, v. 27, n.5, pp.920-931, May 2008.
  53. F. Liu, P. K. Nikolov, and S. Ozev*, “Parametric Variability Analysis for Multi-Stage Analog Circuits Using Analytical Sensitivity Modelling”, in ACM Transactions on Design Automation of Electronics Systems, v.13, n.2, April 2008.
  54. F. Liu and S. Ozev*, “Statistical Test Development for Analog Circuits under High Process Variations”, in IEEE Transactions on CAD, v.26, n.8, pp.1465-1477, August 2007.
  55. F. A. Bower, D. J. Sorin*, and S. Ozev, “Online Diagnosis of Hard Faults in Microprocessors”, ACM Transactions on Architecture and Code Optimization, Vol. 4, No. 2, June 2007.
  56. E. Acar and S. Ozev*, “End-to-end Testing of VCO Modulation RF Transceivers through the Delayed-RF Set-Up”, in IEEE Transactions on VLSI Systems, v.15, n.1, January 2007.
  57. F. Liu, S. Ozev*, and M. Brooke, “Identifying the Source of BW Failures in High Frequency Linear Analog Circuits Based on S-Parameter Measurements”, in  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, v.25, n.11, November 2006.
  58. F. Su, S. Ozev, and K. Chakrabarty*, “Concurrent Testing of Digital Microfluidics-Based Biochips”, in ACM Transactions on Design Automation of Electronics Systems, v.11, n.2 pp. 442-464, April 2006.
  59. F. Bower, S. Ozev, D. J. Sorin*, “A Mechanism for Online Diagnosis of Hard Faults in Microprocessors”, IEEE Transactions on Dependable and Secure Computing, v.3, n.4, pp. 297-310, October-December 2005.
  60. F. Su, S. Ozev*, and K. Chakrabarty, “Ensuring the Operational Health of Droplet-Based Microelectrofluidic Biosensor Systems”, IEEE Sensors Journal, v.5, n.4, pp. 763-773, August 2005.
  61. A. Sehgal, S. Ozev*, K. Chakrabarty, “Test Infrastructure Design for Mixed-Signal SOCs with Wrapped Analog Cores”, in IEEE Transactions on VLSI Systems, v.14, n.3, pp.292-304, March 2006.
  62. F. Su, S. Ozev, and K. Chakrabarty*, “Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems”, in Journal of Electronic Testing: Theory and Applications, v.16, n.2, pp.199-210, April 2006.
  63. S. Ozev and A. Orailoglu*, “Design of Concurrent Test Hardware for Linear Analog Circuits with Constrained Hardware Overhead”, in IEEE Trans. on VLSI Systems, v.12, n.7, pp. 756-765, July 2004.
  64. S. Ozev, I. Bayraktaroglu, and A. Orailoglu*, “Seamless Test of Digital Components in Mixed-Signal Paths”, in “IEEE Design and Test of Computers”, v.21, n.1, pp. 44-55, January-February 2004.
  65. S. Ozev and A. Orailoglu*, “Statistical Tolerance Analysis for Assured Analog Test Coverage”, Journal of Electronic Testing: Theory and Applications, v.19, n. 2, pp. 173-182, April 2003.
  66. S. Ozev and A. Orailoglu*, “Automated System-Level Test Development for Mixed-Signal Circuits”, Int. Journal on Analog Integrated Circuits and Signal Processing, v.35, n.203, pp. 169-178, May-June 2003.
  67. S. Ozev, C. Olgaard, and A. Orailoglu*, “Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers", IEEE Design & Test of Computers, vol. 19, n. 5, pp. 82-91, Sept.-Oct. 2002.
  68. S. Ozev and A. Orailoglu*, “System-Level Test Synthesis for Mixed-Signal SOC Designs", IEEE Trans. on Circuits and Systems II: Analog and Digital Signal Processing pp. 588-599, v.6, n.48, June 2001.

Refereed Conference Publications

  1. Ferhat C. Ataman, Chethan Kumar Y.B., Sandeep Rao, and Sule Ozev, “Improving Angle Of Arrival Estimation Accuracy for mm-Wave Radars”, IEEE International Test Conference, 2023.
  2. Ataman, Ferhat Can, Mohammad Aladsani, Georgios Trichopoulos, Chethan Kumar YB, and Sule Ozev. "Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors." In 2023 IEEE European Test Symposium (ETS), pp. 1-6. IEEE, 2023.
  3. Ataman, Ferhat Can, Muslum Emir Avci, Chethan Kumar YB, and Sule Ozev. "Global Tuning for System Performance Optimization of RF MIMO Radars." In 2023 IEEE European Test Symposium (ETS), pp. 1-4. IEEE, 2023.
  4. M. E. Avci, S. Ozev and Y. B. Chethan Kumar, "Fast RF Mismatch Calibration Using Built-in Detectors," 2022 IEEE 40th VLSI Test Symposium (VTS), 2022, pp. 1-7, doi: 10.1109/VTS52500.2021.9794160.
  5. D. Gulick, Y. Jung, S. Lee, S. Ozev and J. B. Christen, "Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants," 2022 IEEE 40th VLSI Test Symposium (VTS), 2022, pp. 1-7, doi: 10.1109/VTS52500.2021.9794142.
  6. B. Bilgic and S. Ozev, "Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components," 2022 IEEE 40th VLSI Test Symposium (VTS), 2022, pp. 1-7, doi: 10.1109/VTS52500.2021.9794141.
  7. B. Bilgic and S. Ozev, "Guaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing," 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022, pp. 993-998, doi: 10.23919/DATE54114.2022.9774705.
  8. D. Badawi, I. Bassi, S. Ozev and A. E. Cetin, "Detecting Anomaly in Chemical Sensors via Regularized Contrastive Learning," ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), 2022, pp. 86-90, doi: 10.1109/ICASSP43922.2022.9746646.
  9. Diaa Badawi, Agamyrat Agambayev, Sule Ozev, Ahmet Enis Cetin, “Discrete Cosine Transform Based Causal Convolutional Neural Network For Drift Compensation In Chemical Sensors” IEEE ICASSP, 2021.
  10. Ishaan Bassi, Sule Ozev, and Doohwang Chang, “Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration”, in IEEE VLSI Test Symposium, 2021.
  11. Muslum Emir Avci and Sule Ozev, “Design Optimization for N-port RF Network Reflectometers” in IEEE International Test Conference, 2020.
  12. D. Roychowdhury, S. Moallemi, S. Ozev and J. Kitchen, "Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test," 2020 IEEE Radio and Wireless Symposium (RWS), San Antonio, TX, USA, 2020, pp. 16-19, doi: 10.1109/RWS45077.2020.9050038.
  13. Ince, Mehmet, and Sule Ozev. "Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators." In 2020 IEEE European Test Symposium (ETS), pp. 1-2. IEEE, 2020.
  14. Agambayev, Agamyrat, Christopher Lue Sang, Jennifer Blain Christen, and Sule Ozev. "Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments." In 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS), pp. 73-76. IEEE, 2020.
  15. Ince, Mehmet, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, and Sule Ozev. "Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection." In 2019 IEEE European Test Symposium (ETS), pp. 1-6. IEEE, 2019.
  16. McGuire, Matthew, Umit Ogras, and Sule Ozev. "PCB Hardware Trojans: Attack Modes and Detection Strategies." In 2019 IEEE 37th VLSI Test Symposium (VTS), pp. 1-6. IEEE, 2019.
  17. Badawi, Diaa, Sule Ozev, Jennifer Blain Christen, Chengmo Yang, Alex Orailoglu, and A. Enis Çetin. "Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS." In ICASSP 2019-2019 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), pp. 8296-8300. IEEE, 2019.
  18. Gao, Hang, Ganapati Bhat, Umit Y. Ogras, and Sule Ozev. "Optimized Stress Testing for Flexible Hybrid Electronics Designs." In 2019 IEEE 37th VLSI Test Symposium (VTS), pp. 1-6. IEEE, 2019.
  19. Li, Yanjun, Ender Yilmaz, Peter Sarson, and Sule Ozev. "Online information utility assessment for per-device adaptive test flow." In VLSI Test Symposium (VTS), 2018 IEEE 36th, pp. 1-6. IEEE, 2018.
  20. F. Karabacak, U. Y. Ogras and Sule Ozev, “Malicious Activity Analysis for Lightweight IoT Devices,” in Proc. of GOMAC Tech., March 2018. (6 pages)
  21. Ince, Mehmet, Ender Yilmaz, and Sule Ozev. "Enabling fast process variation and fault simulation through macromodelling of analog components." In 2018 IEEE 27th North Atlantic Test Workshop (NATW), pp. 1-6. IEEE, 2018. (6 pages)
  22. Shafiee, Maryam, Jennifer N. Kitchen, and Sule Ozev. "A built-in self-test technique for transmitter-only systems." In VLSI Test Symposium (VTS), 2018 IEEE 36th, pp. 1-6. IEEE, 2018. (6 pages)
  23. Li, Yanjun, Ender Yilmaz, Peter Sarson, and Sule Ozev. "Online information utility assessment for per-device adaptive test flow." In VLSI Test Symposium (VTS), 2018 IEEE 36th, pp. 1-6. IEEE, 2018. (6 pages)
  24. Welker, Richard, Sule Ozev, and Jennifer Kitchen. "Incorporating RF test measurements for efficient design flow of GaN-based power amplifiers." In RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR), 2018 IEEE Topical Conference on, pp. 69-71. IEEE, 2018. (3 pages)
  25. Karabacak, Fatih, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, and Sule Ozev. "RF circuit authentication for detection of process Trojans." In VLSI Test Symposium (VTS), 2018 IEEE 36th, pp. 1-6. IEEE, 2018.
  26. Mehmet Ince, Sule Ozev and Sarma Vrudhula, “Statistical Library Characterization Using Arbitrary Polynomial Chaos”, in IEEE Latin American Symposium on Circuits and Systems, 2017.
  27. Jeong, Jae Woong, Ender Yilmaz, LeRoy Winemberg, and Sule Ozev. "Built-in self-test for stability measurement of low dropout regulator." In Test Conference (ITC), 2017 IEEE International, pp. 1-9. IEEE, 2017.
  28. Shafiee, Maryam, and Sule Ozev. "Receiver echo cancellation with real-time self calibration for passive implanted neuron recorders." In Circuits and Systems (ISCAS), 2017 IEEE International Symposium on, pp. 1-4. IEEE, 2017.
  29. Stevenson, Paul E., Hany Arafa, Sule Ozev, Heather M. Ross, and Jennifer Blain Christen. "Toward wearable, crowd-sourced air quality monitoring for respiratory disease." In Healthcare Innovations and Point of Care Technologies (HI-POCT), 2017 IEEE, pp. 140-143. IEEE, 2017.
  30. Ince, Mehmet, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, and Sule Ozev. "Evaluation of loop transfer function based dynamic testing of LDOs." In Test Conference in Asia (ITC-Asia), 2017 International, pp. 14-19. IEEE, 2017.
  31. Shafiee, Maryam, and Sule Ozev. "Contact-less near-field measurement of RF phased array antenna mismatches." In Test Symposium (ETS), 2017 22nd IEEE, pp. 1-6. IEEE, 2017.
  32. Bhat, Ganapati, Ujjwal Gupta, Nicholas Tran, Jaehyun Park, Sule Ozev, and Umit Y. Ogras. "Multi-objective design optimization for flexible hybrid electronics." In Proceedings of the 35th International Conference on Computer-Aided Design, p. 73-80. ACM, 2016.
  33. Chang, Doohwang, Jennifer Kitchen, and Sule Ozev. "Post-production adaptation of RF circuits for application-specific performance metrics." In Circuits and Systems (ISCAS), 2016 IEEE International Symposium on, pp. 2775-2778. IEEE, 2016.
  34. Jeong, Jae Woong, Jennifer Kitchen, and Sule Ozev. "Process independent gain measurement with low overhead via BIST/DUT co-design." In VLSI Test Symposium (VTS), 2016 IEEE 34th, pp. 1-6. IEEE, 2016.
  35. Karabacak, Fatih, Umit Y. Ogras, and Sule Ozev. "Detection of malicious hardware components in mobile platforms." In Quality Electronic Design (ISQED), 2016 17th International Symposium on, pp. 179-184. IEEE, 2016.
  36. Karabacak, Fatih, Uwadiae Obahiagbon, Umit Ogras, Sule Ozev, and Jennifer Blain Christen. "Making unreliable Chem-FET sensors smart via soft calibration." In Quality Electronic Design (ISQED), 2016 17th International Symposium on, pp. 456-461. IEEE, 2016.
  37. Jae Woong Jeong, Jennifer Kitchen, Sule Ozev, “A Self-Compensating Built-In Self-Test Solution for RF Phased Array Mismatch”, IEEE International Test Conference, 2015
  38. Jae Woong Jeong, Jennifer Kitchen, Sule Ozev, “Robust Amplitude Measurement for RF BIST Applications” IEEE European Test Symposium, May 2015.
  39. Navankur Beohar,  Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Bertan Bakkaloglu, Sule Ozev, “Disturbance-free BIST for Loop Characterization of DC-DC Buck Converters”, IEEE VLSI Test Symposium, 2015.
  40. Doohwang Chang, Bertan Bakkaloglu, Sule Ozev, “Enabling Unauthorized RF Transmission below Noise Floor with no Detectable Impact on Primary Communication Performance”, IEEE VLSI Test Symposium, 2015.
  41. Erol, Osman Emir, Sule Ozev, Chandra Suresh, Rubin Parekhji, and Lakshmanan Balasubramanian. "On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC." In Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, pp. 1559-1562. IEEE, 2015.
  42. Chang, Doohwang, et al. "Reliability enhancement using in-field monitoring and recovery for RF circuits." VLSI Test Symposium (VTS), 2014 IEEE 32nd. IEEE, 2014.
  43. Liu, Tao, Chao Fu, Sule Ozev, and Bertan Bakkaloglu. "A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters." In VLSI Test Symposium (VTS), 2014 IEEE 32nd, pp. 1-6. IEEE, 2014.
  44. Jeong, Jae Woong, Sule Ozev, Friedrich Taenzler, and Hui-Chuan Chao. "Development and empirical verification of an accuracy model for the power down leakage tests." In VLSI Test Symposium (VTS), 2014 IEEE 32nd, pp. 1-6. IEEE, 2014.
  45. Jeong, Jae Woong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, and Mustapha Slamani. "Built-in self-test and characterization of polar transmitter parameters in the loop-back mode." In Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, pp. 1-6. IEEE, 2014.
  46. Chang, Doohwang, Sule Ozev, Ozgur Sinanoglu, and Ramesh Karri. "Approximating the age of RF/analog circuits through re-characterization and statistical estimation." In Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, pp. 1-4. IEEE, 2014.
  47. Venkatasubramanian, Ramachandran, Sule Ozev, and Kent Oertle. "Rail clamp with dynamic time constant adjustment." In Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th, pp. 1-7. IEEE, 2014.
  48. Suresh, Chandra K.H.; Yilmaz, Ender; Ozev, Sule; Sinanoglu, Ozgur, "Adaptive reduction of the frequency search space for multi-vdd digital circuits," Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 , vol., no., pp.292,295, 18-22 March 2013.
  49. Yilmaz, Ender; Shofner, Geoff; Winemberg, LeRoy; Ozev, Sule, "Fault analysis and simulation of large scale industrial mixed-signal circuits," Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013.
  50. Nassery, A.; Ozev, S.; Slamani, M., "Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion," Test Symposium (ETS), 2013 18th IEEE European , vol., no., pp.1,6, 27-30 May 2013.
  51. Jae Woong Jeong; Ozev, S.; Sen, S.; Mak, T.M., "Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters," VLSI Test Symposium (VTS), 2013 IEEE 31st , vol., no., pp.1,6, April 29 2013-May 2 2013.
  52. Deng, Lingfei; Kundur, Vinay; Naga, Naveen Sai Jangala; Ozel, Muhlis Kenan; Yilmaz, Ender; Ozev, Sule; Bakkaloglu, Bertan; Kiaei, Sayfe; Pratab, Divya; Dar, Tehmoor, "Electrical calibration of spring-mass MEMS capacitive accelerometers," Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 , vol., no., pp.571,574, 18-22 March 2013.
  53. Yilmaz, E.; Ozev, S.; Butler, K.M., "Adaptive quality binning for analog circuits," Test Symposium (ETS), 2013 18th IEEE European , vol., no., pp.1,6, 27-30 May 2013.
  54. Nassery, A.; Jae Woong Jeong; Ozev, S., "Zero-overhead self test and calibration of RF transceivers," Test Conference (ITC), 2013 IEEE International , vol., no., pp.1,9, 6-13 Sept. 2013.
  55. Suresh, Chandra KH, Ozgur Sinanoglu, and Sule Ozev. "Adaptive testing of chips with varying distributions of unknown response bits." In Test Symposium (ETS), 2012 17th IEEE European, pp. 1-6. IEEE, 2012.
  56. Yilmaz, Ender, Sule Ozev, Ozgur Sinanoglu, and Peter Maxwell. “Adaptive testing: Conquering process variations”,  IEEE European  Test Symposium, pp. 1-6, 2012.
  57. R. Venkatasubramanian, D.-H. Chang, and S. Ozev, “Analysis and Mitigation of Electromigration in RF Circuits:  An LNA Case Study”, IEEE European Test Symposium, 2011.
  58. A. Nassery, S. Ozev, M. Verhelst, and M. Slamani, “Extraction of EVM from Transmitter System Parameters”, accepted IEEE European Test Symposium, 2011.
  59. E. Yilmaz and S. Ozev, “Fast and Accurate DPPM Computation Using Model Based Filtering”, IEEE European Test Symposium, 2011.
  60. E. Yilmaz, A. Meixner, and S. Ozev, “An Industrial Case Study of Analog Fault Modeling”, IEEE VLSI Test Symposium, 2011.
  61. E. Yilmaz, S. Ozev, and K. M. Butler, “Adaptive Test Flow for Mixed-Signal/RF Circuits Using Learned Information from Device Under Test”, IEEE International Test Conference, 2010.
  62. E. Yilmaz and S. Ozev, “Accurate Multi-Specification DPPM Estimation Using Layered Sampling Based Simulation”, IEEE International Symposium on Quality Electronic Design, 2010, pp.320-326.
  63. E. Yilmaz, A. Nassery, E. Acar, and S. Ozev, “Built-in EVM Measurement for OFDM Transcievers Using All-digital DFT”, in IEEE International Test Conference, November 2009.
  64. E. Yilmaz and S. Ozev, “Defect-Based Test Optimization for Analog/RF Circuits for Near-Zero DPPM Applications”, in IEEE International Conference on Computer Design, October 2009.
  65. E. Yilmaz and S. Ozev, “Adaptive test elimination for analog/RF circuits”, in IEEE/ACM Design Automation Conference, June 2009, Page(s):720 – 725.
  66. H.-G. Stratigopoulos, S. Mir, E. Acar, and S. Ozev, “Defect Filter for Alternate RF Test”, in IEEE European Test Symposium, May  2009, Page(s):101 – 106.
  67. E. S. Erdogan and S. Ozev, “A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources”, in IEEE VLSI Test Symposium, May 2009 Page(s):303 – 308.
  68. E. Acar, S. Ozev, G. Srinivasan, and F. Taenzler, “Optimized EVM Testing for IEEE 802.11a/n RF ICs”, in IEEE International Test Conference, October 2008, Page(s):1 - 10.
  69. E. Yilmaz and S. Ozev, “Dynamic Test Scheduling for Analog Circuits for Improved Test Quality”, in IEEE International Conference on Computer Design, October 2008, Page(s):227 - 233.
  70. E. Erdogan, S. Ozev, and P. Cauvet, “Diagnosis of assembly failures for System-in-Package RF tuners”, IEEE International Symposium on Circuits and Systems, pp. 2286-2289, May 2008, Page(s):2286 - 2289.
  71. E. Erdogan, S. Ozev, and L. M. Collins, “Online SNR detection for dynamic power management in wireless ad-hoc networks”, Ph.D. Research in Microelectronics and Electronics, June 2008.
  72. E. Erdogan and  S. Ozev , “Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers”, IEEE VLSI Test Symposium, pp. 209-214, May 2008.
  73. Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, and Sule Ozev. "Reducing the Impact of Intra-Core Process Variability with Criticality-Based Resource Allocation and Prefetching." ACM International Conference on Computing Frontiers, May 2008.
  74. E. Acar and S. Ozev, “Low Cost Characterization of RF Transceivers through IQ Data Analysis”, in IEEE International Test Conference, 2007.
  75. F. Liu, E. Acar, and S. Ozev, “Test Yield Estimation for Analog/RF Circuits”, in IEEE International Test Conference, 2007.
  76. F. Liu and S. Ozev, “Efficient Simulation of Parametric Faults for Multi-Stage Analog Circuits”, in IEEE International Test Conference, 2007.
  77. M. Yilmaz, A. Meixner, S. Ozev, and D. J. Sorin, “Lazy Error Detection for Microprocessor Functional Units”, International Symposium on Defect Tolerance, pp. 361-369, September 2007.
  78. E. Acar and S. Ozev, “Digital Calibration of RF Transceivers for I-Q Imbalances and Nonlinearity”, in IEEE International Conference on Computer Design, October 2007.
  79. M. Yilmaz, S. Ozev, and D. J. Sorin, “Low-Cost Run-time Diagnosis of Hard Delay Faults in the Functional Units of a Microprocessor”, in IEEE International Conference on Computer Design, October 2007.
  80. E. Acar, S. Ozev, and K. B. Redmond, “A Low-cost RF MIMO Test Method Using a Single Measurement Set-up”, in IEEE VLSI Test Symposium, 2007.
  81. E. S. Erdogan and S. Ozev, “An ADC-BiST Scheme Using Sequential Code Analysis”, accepted for publication in IEEE Design Automation and Test in Europe Conference, 2007.
  82. S. Bahukudumbi, S. Ozev, K. Chakrabarty, V. Iyengar, “A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs”, in IEEE/ACM Asia and South Pacific Design Automation Conference, January 2007.
  83. E. S. Erdogan and S. Ozev, “A Robust, Self-Tuning Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise”, in IEEE International Test Conference, October 2006.
  84. M. Yilmaz, D. R. Hower, S. Ozev, and D. J. Sorin, “Self-Detecting and Self-Diagnosing 32-bit Microprocessor Multiplier” in IEEE International Test Conference, October 2006.
  85. E. Acar and S. Ozev, “Efficient Testing of RF MIMO Transceivers Used in WLAN Applications”, in IEEE International Conference on Computer Design, October 2006.
  86. E. Acar, S. Ozev, and K. B. Redmond, “Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN Transceivers”, in IEEE International Conference on Computer-Aided Design, November 2006.
  87. F. Liu and S. Ozev, “Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework”, in IEEE VLSI Test Symposium, pp.272-277, April 2006.
  88. Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, and Sule Ozev. "Applying Architectural Vulnerability Analysis to Hard Faults in the Microprocessor” in ACM SIGMETRICS/Performance, pp.375-376, June 2006.
  89. F. Bower, D. J. Sorin, and S. Ozev, “A Mechanism for Online Diagnosis of Hard Faults in Microprocessors”, IEEE/ACM International Conference on Microarchitecture, pp.197-208, November 2005.
  90. E. Acar and S. Ozev, “Defect-Based RF Testing Using a New Catastrophic Fault Model” IEEE International Test Conference, pp.17.3-1—17.3-9, November 2005.
  91. E. Acar and S. Ozev, “Parametric Test Development for RF Circuits Targeting Physical Fault Locations and Using Specification-Based Fault Definitions” IEEE International Conference on Computer-Aided Design, pp. 73-79, November 2005.
  92. F. Liu and S. Ozev, “Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits”, IEEE International Conference on Computer Design, pp.161-168, October 2005.
  93. A. Sehgal, S. Ozev, and K. Chakrabarty, “A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs”, IEEE International Conference on Computer Design, October 2005.
  94. E. Acar and S. Ozev, “Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements”, in IEEE VLSI  Test Symposium, pp.374-379, April 2005.
  95. F. Liu, J.J. Flomenberg, D.V. Yasaretne, and S. Ozev, “Hierarchical Variance Analysis for Analog Circuits Based on Graph Modeling and Correlation Loop Tracing”, in IEEE Design Automation and Test in Europe, pp.126-131, March 2005.
  96. S. Ozev, J.R. Carter, and D. Sorin, “Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown”, in IEEE Design, Automation, and Test in Europe, pp.300-305, March 2005.
  97. A. Sehgal, F. Liu, S. Ozev, and K. Chakrabarty, “Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores”, IEEE Design, Automation, and Test in Europe, pp.50-55, March 2005.
  98. F. Liu and S. Ozev, “Hierarchical Analysis of Process Variation for Mixed-Signal Systems”, in IEEE/ACM Asia and South Pacific Design Automation Conference, 2005.
  99. S. Ozev and A. Orailoglu, “End-to-end Testability Analysis and DfT Insertion for Mixed-Signal Paths”,   in IEEE International Conference on Computer Design, 2004.
  100. F. Liu, S. Ozev, and M. Brooke, “Diagnosis of Small-Signal Parameters for Broadband Amplifiers through S-Parameter Measurements and Sensitivity-Guided Evolutionary Search, in IEEE Int. Conf. on CAD, pp.641-647, November 2004.
  101. E. Acar and S. Ozev, “Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis”, in IEEE International Test Conference, 2004.
  102. F. Su, S. Ozev, and K. Chakrabarty, “Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays”, in IEEE International Test Conference, 2004.
  103. F. Su, S. Ozev, and K. Chakrabarty, “Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems”, in IEEE European Test Symposium, 2004.
  104. Fred A. Bower, Paul G. Shealy, Sule Ozev, and Daniel J. Sorin, “Tolerating Hard Faults in Microprocessor Array Structures”, in International Conference on Dependable Systems and Networks (DSN-3), June 2004.
  105. S. Ozev and C. Olgaard, “Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures”, in IEEE VLSI Test Symposium, April 2004.
  106. A. Sehgal, S. Ozev, and K. Chakrabarty, “TAM Optimization for Mixed-Signal SOCs using Test Wrappers for Analog Cores”, in IEEE International Conference on Computer-Aided-Design, pp.95-99, November 2003.
  107. F. Su, S. Ozev, and K. Chakrabarty, “Testing of Droplet-Based Microelectrofluidic Systems”, in IEEE International Test Conference, pp. 1192-1200, October 2003.
  108. S. Ozev and A. Orailoglu, “Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits", IEEE International Conference on Computer Design, pp. 258-264, September 2002.
  109. S. Ozev, H. Haggag, and A. Orailoglu, “Automated Test Development and Test Time Reduction for RF Subsystems", IEEE International Symposium on Circuits and Systems, vol.1, pp. 581-584, May 2002.
  110. S. Ozev and A. Orailoglu, “Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis", IEEE VLSI Test Symposium, pp.213-219, April 2002.
  111. S. Ozev, A. Orailoglu, “An Integrated Tool for Analog Test Generation and Fault Simulation", IEEE International Symposium on Quality Electronic Design, March 2002, pages 267-272.
  112. S. Ozev, C. Olgaard, and A. Orailoglu, “Testability Implications in Low-Cost Integrated Radio Transceivers: A Bluetooth Case Study", IEEE International Test Conference, November 2001.
  113. S. Ozev and A. Orailoglu, “Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems”, IEEE VLSI Test Symposium, pp. 149-154, May 2000.
  114. S. Ozev, I. Bayraktaroglu, and A. Orailoglu, “Test Synthesis for Mixed Signal SOC Paths”, IEEE Design Automation and Test in Europe, pp. 128-133, March 2000.
  115. S. Ozev, A. Orailoglu, “Path-Based Test Composition for Mixed-Signal SOCs", Southwest Symposium on Mixed-Signal Design, February 2000, pages 153-158.
  116. S. Ozev and A. Orailoglu, “Block-Based Test Integration for Analog Integrated Circuits”, IEEE Latin American Test Workshop, pp. 128-132, March 2000.
  117. S. Ozev and A. Orailoglu, “Low-Cost Test for Large Analog IC's", IEEE International Symposium on Defect and Fault Tolerance, pp. 101-109, November 1999.
  118. S. Ozev, A. Altinordu, and G. Dundar, “Implementation of a Radix-2n Multiplier Using High Performance Logic” IEEE Mediterranean Electrotechnical Conference, v. III, pp. 469-472, May 1996.
Research Activity
  • Ozev,Sule*. Built-In Self-Test Techniques for Test Calibration and Trimming of Power Management Units: PMU-BIST. SEMICONDUCTOR RESEARCH CORP(5/18/2015 - 5/17/2016).
  • Bakkaloglu,Bertan*, Ozev,Sule. Online Self-Test and Reliability Monitoring of Satellite Space Power Converters. JPL(4/8/2015 - 12/30/2015).
  • Blain Christen,Jennifer Mary*, Ogras,Umit Y., Ozev,Sule. EAGER: Adaptive Performance Models of Sensing Systems for Design Space Exploration. NSF-CISE-CCF(9/1/2014 - 8/31/2016).
  • Ozev,Sule*. Built-In Self-Test Techniques for Test Calibration and Trimming of Power Management Units: PMU-BIST. UNIV OF TEXAS-DALLAS(8/1/2013 - 7/31/2016).
  • Ozev,Sule*, Bakkaloglu,Bertan, Kiaei,Sayfe. GIFT: Electrical Stimulus-Based Built-in Self Characterization for Calibration and Process Feedback of MEMS Devices. SEMICONDUCTOR RESEARCH CORP(6/24/2013 - 8/31/2015).
  • Ozev,Sule*. Defect Based Analog Circuit Diagnosis and Yield Enhancement (ASUF 30005817). ASU FDN(5/1/2013 - 4/30/2017).
  • Ozev,Sule*. Adaptive Test strategies for Minimum Energy Electronic Systems. NEW YORK UNIV(9/1/2012 - 1/31/2015).
  • Ozev,Sule*. NSF Career Writing Workshop. NSF-CISE(5/15/2012 - 4/30/2013).
  • Ozev,Sule*. Low Cost Universal Reliability System On-A-Chip for Multi-Channel Characterization. NUTREK(4/16/2012 - 1/21/2014).
  • Ozev,Sule*. XX:Small: Unified Framework for Adaptive Analog and Digital Performance Characterization Using Learned Information from the Circuit Under Test. NSF-CISE-CCF(7/1/2011 - 6/30/2016).
  • Ozev,Sule*, Bakkaloglu,Bertan, Kiaei,Sayfe. Electrical Stimulus-Based Built-in Self Characterization for Calibration and Process Feedback of MEMS Devices. SEMICONDUCTOR RESEARCH CORP(7/1/2011 - 8/31/2015).
  • Vermeire,Bert*, Bakkaloglu,Bertan, Ozev,Sule. Clock Multiplier and Serial IO Circuits for Ultra Power On-chip ADs. NUTREK(3/1/2011 - 12/31/2013).
  • Ozev,Sule*. Single Set-Up Detailed Testing of Wireless Transceiver Front-Ends Using Digital Processing. UNIV OF TEXAS-DALLAS(3/1/2011 - 5/31/2014).
  • Kiaei,Sayfe*, Bakkaloglu,Bertan, Ozev,Sule. IUCRC GOALI: Autonomous Self-Healing Sensor Network Radio and Mixed-Signal Readout system. NSF-ENG(8/1/2010 - 7/31/2014).
  • Kiaei,Sayfe*, Bakkaloglu,Bertan, Ozev,Sule. C/S: I/UCRC GOALI: Autonomous Self-Healing Sensor Network Radio and Mixed-Signal Readout system. TEXAS INSTRUMENTS(8/1/2010 - 7/31/2014).
  • Ozev,Sule*. Structural Fault Modeling, Testing, and Defect Level Estimation for Analog/RF Circuits - Year 2. UNIV OF TEXAS-DALLAS(8/1/2009 - 4/30/2011).
  • Ozev,Sule*. Characterization of RF Transceivers Using Digital Testers. SEMICONDUCTOR RESEARCH CORP(8/1/2009 - 7/31/2016).
  • Ozev,Sule*. Structural Fault Modeling, Testing, and Defect Level Estimation for Analog/RF Circuits. UNIV OF TEXAS-DALLAS(8/1/2008 - 7/31/2009).
  • Ozev,Sule*. CAREER:Hierarchical Process Variability Analysis of Analog Circuits Geared for Test and Diagnosis. NSF-CISE(8/1/2008 - 2/8/2013).
  • Ozev,Sule*. Collaborative Research:Hierarchical Testing and Yield Enhancement of High End Integrated RF Systems. NSF-CISE(8/1/2008 - 9/30/2009).
Courses
2023 Fall
Course Number Course Title
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 792 Research
EEE 592 Research
EEE 590 Reading and Conference
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
2023 Summer
Course Number Course Title
EEE 790 Reading and Conference
EEE 690 Reading and Conference
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 792 Research
EEE 799 Dissertation
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 592 Research
EEE 592 Research
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 590 Reading and Conference
EEE 592 Research
EEE 599 Thesis
EEE 792 Research
2023 Spring
Course Number Course Title
EEE 499 Individualized Instruction
EEE 334 Circuits II
EEE 492 Honors Directed Study
EEE 790 Reading and Conference
EEE 592 Research
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 690 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 799 Dissertation
EEE 595 Continuing Registration
EEE 792 Research
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 590 Reading and Conference
EEE 334 Circuits II
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 334 Circuits II
EEE 334 Circuits II
EEE 522 RF Test
2022 Fall
Course Number Course Title
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
2022 Summer
Course Number Course Title
EEE 790 Reading and Conference
EEE 690 Reading and Conference
EEE 592 Research
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 590 Reading and Conference
2022 Spring
Course Number Course Title
EEE 790 Reading and Conference
EEE 592 Research
EEE 499 Individualized Instruction
EEE 690 Reading and Conference
EEE 595 Continuing Registration
EEE 492 Honors Directed Study
EEE 599 Thesis
EEE 792 Research
EEE 799 Dissertation
EEE 595 Continuing Registration
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 334 Circuits II
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 334 Circuits II
EEE 334 Circuits II
EEE 334 Circuits II
2021 Fall
Course Number Course Title
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
2021 Summer
Course Number Course Title
EEE 690 Reading and Conference
EEE 590 Reading and Conference
EEE 790 Reading and Conference
EEE 592 Research
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 590 Reading and Conference
CEN 592 Research
2021 Spring
Course Number Course Title
EEE 790 Reading and Conference
EEE 592 Research
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 690 Reading and Conference
EEE 595 Continuing Registration
EEE 492 Honors Directed Study
EEE 334 Circuits II
EEE 599 Thesis
EEE 792 Research
EEE 799 Dissertation
EEE 595 Continuing Registration
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 334 Circuits II
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 334 Circuits II
EEE 334 Circuits II
2020 Fall
Course Number Course Title
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
2020 Summer
Course Number Course Title
EEE 690 Reading and Conference
EEE 590 Reading and Conference
EEE 790 Reading and Conference
EEE 592 Research
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 590 Reading and Conference
2020 Spring
Course Number Course Title
EEE 790 Reading and Conference
EEE 425 Digital Systems and Circuits
EEE 592 Research
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 690 Reading and Conference
EEE 595 Continuing Registration
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 599 Thesis
EEE 792 Research
EEE 799 Dissertation
EEE 425 Digital Systems and Circuits
EEE 595 Continuing Registration
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 425 Digital Systems and Circuits
EEE 591 Seminar
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 591 Seminar
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
2019 Fall
Course Number Course Title
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
2019 Summer
Course Number Course Title
EEE 590 Reading and Conference
EEE 790 Reading and Conference
EEE 592 Research
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 590 Reading and Conference
2019 Spring
Course Number Course Title
EEE 790 Reading and Conference
EEE 425 Digital Systems and Circuits
EEE 592 Research
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 690 Reading and Conference
EEE 595 Continuing Registration
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 599 Thesis
EEE 792 Research
EEE 799 Dissertation
EEE 425 Digital Systems and Circuits
EEE 595 Continuing Registration
EEE 590 Reading and Conference
EEE 795 Continuing Registration
EEE 425 Digital Systems and Circuits
EEE 591 Seminar
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 591 Seminar
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
2018 Fall
Course Number Course Title
EEE 425 Digital Systems and Circuits
EEE 425 Digital Systems and Circuits
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 499 Individualized Instruction
EEE 590 Reading and Conference
EEE 595 Continuing Registration
EEE 599 Thesis
EEE 690 Reading and Conference
EEE 790 Reading and Conference
EEE 792 Research
EEE 795 Continuing Registration
EEE 799 Dissertation
EEE 592 Research
EEE 591 Seminar
EEE 595 Continuing Registration
EEE 492 Honors Directed Study
EEE 493 Honors Thesis
EEE 522 RF Test
EEE 499 Individualized Instruction
EEE 499 Individualized Instruction
Honors / Awards
  • ASU Joseph Palais Distinguished Faculty Scholar Award, 2023-2024
  • Best paper award, IEEE VLSI Test Symposium, 2022
  • Best paper award, IEEE European Test Symposium, 2019
  • Fulton Exemplar Faculty award (2018-2019)
  • Best paper award, IEEE Latin American Symposium on Circuits and Systems, 2017
  • Best paper, honorable mention award, VLSI Test Symposium, 2015
  • Best paper award, VLSI Test Symposium, 2014
  • Honorable Mention Award, VLSI Test Symposium, 2013
  • Honorable Mention award, International Test Conference, 2011
  • Best student paper award, International Test Conference, 2009
  • Best paper award, European Test Symposium, 2009
  • IBM Austin Center for Advanced Studies 2006/2007 Faculty Award.
  • Best session award, VTS 2006 (Three Questions to the Oracle).
  • Best paper award, ICCD 2005
  • Best Dissertation Award, University of California, San Diego, Department of Computer Science and Engineering, 2003.
  • 2002 IEEE VLSI Test Symposium TTTC Naveena Nagi Award, 2002.
  • IBM Corporation Co-operative Fellowship Award (2000-2002).
  • UCSD Flaviu Cristian Research Award (1999-2001). 
Service

She served as an associate editor for IEEE Transactions on VLSI systems (2007-2014) and served on various program committees, including IEEE VLSI Test Symposium (2008-2015), IEEE International Test Conference (2007-2015), IEEE International Conference on Computer Design (2004-2015), and IEEE European Test Symposium (2006-2015). She is the program chair of the International Conference on Computer Design (2013-2015) and was the general chair for IEEE International Mixed-Signals, Sensors and Systems 2009.

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