Research Activity
- Hirleman,Edwin Daniel. DEFECTS IN EPITAXIAL LAYERS. METROLOGY CONSORTIUM(5/15/1999 - 12/31/2002).
- Diaz,Rodolfo Enrique*, Hirleman,Edwin Daniel. FEASIBILITY OF PARAMETRIC DAMPING FOR ATTENUATION OF ENVIRONMENTAL NOISE. HEXCEL CORP(12/16/1998 - 3/31/2000).
- Hirleman,Edwin Daniel*, Diaz,Rodolfo Enrique. DETECTION OF SURFACE NANOPARTICLES BEYOND THE .07 UM GENERATION PARTICLE SCATTERING USING EXTREME ULTRAVIOLET RADIATION. SEMICONDUCTOR RESEARCH CORP(11/1/1998 - 10/31/1999).
- Diaz,Rodolfo Enrique*, Hirleman,Edwin Daniel. CONSORTIUM FOR METROLOGY OF SEMICONDUCTOR NANODEFECTS. LAWRENCE LIVERMORE NATL LAB(7/1/1998 - 12/31/2002).
- Hirleman,Edwin Daniel. DETECTION OF SURFACE NANOPARTICLES BEYOND THE 0.07 UM GENERATION USING ULRAVIOLET RADIATION. SEMICONDUCTOR RESEARCH CORP(11/1/1997 - 10/31/1998).
- Hirleman,Edwin Daniel*, Diaz,Rodolfo Enrique. CONSORTIUM FELLOWSHIP FUND. METROLOGY CONSORTIUM(7/1/1997 - 12/31/2001).
- Hirleman,Edwin Daniel. OPTICAL CHARACTERIZATION OF CONTACT/VIA ETCH INTEGRITY USING LIGHT SCATTERING. SEMATECH(5/15/1997 - 4/30/1998).
- Hirleman,Edwin Daniel. DETECTION OF SURFACE NANOPARTICLES: WAFER INSPECTION BEYOND 0.1 UM GENERATION. SEMICONDUCTOR RESEARCH CORP(9/1/1996 - 10/31/1997).
- Hirleman,Edwin Daniel. DETECTION OF SURFACE NANOPARTICLES. SEMICONDUCTOR RESEARCH CORP(9/1/1996 - 10/31/1997).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY PARTICLES ON PATTERNED WAFERS. SEMICONDUCTOR RESEARCH CORP(9/1/1995 - 8/31/1996).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY PARTICLES ON PATTERNED WAFERS. SEMICONDUCTOR RESEARCH CORP(9/1/1994 - 8/31/1995).
- Hirleman,Edwin Daniel. ATRC-AZ TRANSPORTATION RESEARCH CNTR PROGRAM. AZ DEPT OF TRANSPORTATION(7/1/1994 - 8/31/1997).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY PARTICLES ON SURFACES. SEMATECH(1/1/1994 - 3/31/1996).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY PARTICLES ON SURFACES. SEMICONDUCTOR RESEARCH CORP(10/1/1993 - 8/31/1994).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY PARTICLES ON SURFACES. SEMICONDUCTOR RESEARCH CORP(9/1/1992 - 9/30/1993).
- Hirleman,Edwin Daniel. SRC ED ALLIANCE GRADUATION FELLOWSHIP PROGRAM. SRC EDUCATION ALLIANCE(8/16/1992 - 12/31/1993).
- Hirleman,Edwin Daniel. PARTICLE DIAGNOSTICS IN OPTICALLY THICK SPRAYS. DOD-AIR FORCE(9/15/1990 - 12/31/1991).
- Hirleman,Edwin Daniel. SECOND INT'L CONGRESS ON PARTICLE SIZING TEMPE/PHX 3-5-9 90. NSF(1/1/1990 - 12/31/1990).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY RAYLEIGH PARTICLES. IBM(9/1/1989 - 3/20/1992).
- Hirleman,Edwin Daniel. LIGHT SCATTERING BY RAYLEIGH PARTICLES ON SURFACES. SEMICONDUCTOR RESEARCH CORP(9/1/1989 - 8/31/1992).
- Mcneill,Barry Whitcomb*, Hirleman,Edwin Daniel. ARTIFICIAL INTELLIGENCE AND CONFLICT RESOLUTION TASK I. MCDONNELL DOUGLAS(6/1/1989 - 2/21/1992).
- Peck,Robert E*, Hirleman,Edwin Daniel. SPRAY COMBUSTION COMPLEX FLOWS. GARRETT TURBINE INDUSTRIES(1/1/1989 - 6/30/1992).
- Mcneill,Barry Whitcomb*, Golshani,Forouzan, Hirleman,Edwin Daniel. ARTIFICIAL INTELLIGENCE & THE ENGINEERING DESIGN PROCESS. MCDONNELL DOUGLAS(10/1/1988 - 1/31/1992).
- Mcneill,Barry Whitcomb*, Hirleman,Edwin Daniel. PARDNER: ENGINEERING PROCESS METRICS. MCDONNELL DOUGLAS(9/1/1987 - 7/20/1989).
- Hirleman,Edwin Daniel. MULTPL SCATTERING & INVERSE FRAUNHOFER DIFFRACTION PARTICLE. DOD-AIR FORCE(9/30/1984 - 5/29/1990).
- Hirleman,Edwin Daniel. PROJECT SQUID. DOD-NAVY(3/1/1979 - 10/15/1986).
Presentations