Umberto Celano

Umberto Celano received the B.Eng. and M.Sc. degrees in Electrical Engineering from the Sapienza University of Rome, Italy, in 2009 and 2011, respectively, and the Ph.D. degree in Physics from the University of Leuven - KU Leuven (honourable mention) in 2015. He is now Associate Professor in the School of Electrical, Computer and Energy Engineering at Arizona State University. He is also metrology and characterization capability lead of the SWAP Hub for the Department of Defense Microelectronics Commons, and the materials characterization lead in the National Advanced Packaging Manufacturing Program SHIELD USA.

Before moving to ASU Umberto contributed in various roles to the process development and characterization of advanced CMOS materials (logic and memory), working as a principal member of technical staff at imec (Belgium), and part-time professor in the faculty of science and technology at the University of Twente (the Netherlands). In 2018, he was a visiting scientist with the Geballe Laboratory for Advanced Materials at Stanford University where he expanded his research interest to two-dimensional (2D) materials and nanophotonic. Previously, Umberto worked alongside Prof. Wilfried Vandervorst at the University of Leuven - KU Leuven and imec (Belgium). Here, he got interested in materials analysis and semiconductor metrology with emphasis on the correlation between device physics, materials properties, and failure analysis. 

Prof. Celano’s current research focuses on nanoelectronics at the interface of condensed matter physics, materials analysis, and semiconductor technology. His group is currently engaged in studying fundamental processes that govern the operation of emerging devices, using nanoscale analytical instruments to achieve device reliability, failure analysis, and correlative metrology. With a multidisciplinary approach, his research work combines device physics and reliability, materials science, and metrology.

Dr. Celano has authored and co-authored over 150 scientific contributions in peer-reviewed journal papers, book chapters, and conference proceedings, and has given over 50 invited talks and seminars. He also regularly serves as a member of technical program committees and steering committees, as well as session chairman and session organizer, at top-tier conferences on nanoelectronics, reliability, and metrology. Dr. Celano is a member of the IEEE, the International Roadmap for Devices and Systems (IRDS), and the Die-Level Roadmap Council (DLRC). He is also the recipient of the 2013 IEDM Roger Haken Award and has acted as member of the ACS Nano Letters Early Career Editorial Advisory Board.