Umberto Celano
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650 East Tyler Mall Tempe, AZ 85281-5706
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Mail code: 5706Campus: Tempe
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Umberto Celano is an associate professor with Ira A. Fulton Schools of Engineering at Arizona State University. His research agenda focuses on nanoelectronics at the interface of condensed matter physics, materials analysis, and semiconductor technology. His group is currently engaged in studying fundamental processes underlying the operation of emerging devices, with emphasis on design and use of nanoscale analytical instruments for device reliability, failure analysis, and correlative metrology. As such, his work is inherently multidisciplinary in nature blending device physics and reliability, with materials science and metrology.
Previously, Umberto received his Ph.D. working with Prof. Wilfried Vandervorst at the University of Leuven - KU Leuven and imec (Belgium). Here, he got interested in materials analysis and semiconductor metrology with emphasis on scanning probe microscopies, working to establish a novel three-dimensional nanoscale imaging technique to study materials in confined volumes (this work got him the 2013 IEDM Roger Haken Award). Later, he joined imec as a permanent researcher, contributing in various roles to the development and characterization of materials for advanced CMOS (logic and memory). In 2018, he was a visiting scientist with the Geballe Laboratory for Advanced Materials at Stanford University where he expanded his research interest to two-dimensional (2D) materials and nanophotonic. In 2019, he returned at imec as a principal member of technical staff and joined the faculty of science and technology at the University of Twente (Netherlands) as a part-time assistant professor.
The group’s research interest lies at the interface of surface/volumetric analysis for semiconductor materials, nanoscale characterization of nanoelectronics devices, and the design of analytical instruments. Our vision is to develop methods, and design experiments that generate fundamental understanding between device physics, nanoscale physical and chemical phenomena with relevant materials properties. The primary research goal is to enable a rich suite of techniques for the quantitative extraction of electrical properties of materials used in emerging nanoelectronics. We take a holistic approach correlating input from multiple metrology methods for nanomaterials while working to push the constraints imposed by the physics of the data generation and sensing with machine learning and artificial intelligence. This often involves the development of novel methods, integration of signal treatment and data acquisition process that can be used to optimize new device functions, understand failures, and accelerate the learning cycle in chip manufacturing environments.
We are interested in emerging device concepts with emphasis on ultra-scaled field-effect transistors application (FinFET, nanosheets, forksheets, and 2D materials), non-volatile memory devices including non-charge-based, and three-dimensional (3D) architectures. In addition, we explore in-situ/operando sensing for technologically important magnetic and energy materials.
- Next-generation AFM presented at SPIE - 2021 (link)
- ACS Axial - A Small Change That Could Make a Big Difference in Portable Electronics (link)
- Siliconsemiconductor.net - Advantages Of High Vacuum For Electrical Scanning Probe Microscopy – (link)
- Semiconductor-digest.com - A novel characterization technique unveils the 3D structure of conductive filaments in resistive switching memories - (link)
- EEtimes.com - ReRAMs: Forming Scaling and Quantized Conductance - (link)
Courses
2023 Spring
Course Number | Course Title |
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EEE 790 | Reading and Conference |
EEE 595 | Continuing Registration |
EEE 499 | Individualized Instruction |
EEE 493 | Honors Thesis |
EEE 492 | Honors Directed Study |
EEE 795 | Continuing Registration |
EEE 590 | Reading and Conference |
EEE 792 | Research |
EEE 799 | Dissertation |
EEE 592 | Research |
EEE 792 | Research |
EEE 599 | Thesis |
EEE 492 | Honors Directed Study |
EEE 595 | Continuing Registration |
EEE 690 | Reading and Conference |
EEE 499 | Individualized Instruction |
EEE 493 | Honors Thesis |
EEE 202 | Circuits I |
- PhD dissertation selected for publication in the Springer Theses books collection (2016)
- Honorable mention for PhD Thesis from KU Leuven - Science@Leuven (2016)
- Best Paper at INC10 – NIST Gaithersburg, MD (2014)
- imec PhD Excellence award (2013)
- Roger A. Haken Best Student Paper Award at the international electron devices meeting IEDM 2013
- AVS executive committee member in the “Nanoscale Science and Technology Division” (2019 – present)
- Member of the IEEE International Roadmap for Devices and Systems (IRDS) (2014 – present)
- SEMI standards committee member for doping in advanced CMOS technology (2018-2019)
- Member of Nano Letters young career editorial board (2015 – 2019)